Spectroscopic ellipsometry characterization of polymer-fullerene blend films

A. M.C. Ng; K. Y. Cheung; M. K. Fung; A. B. Djurišić; W. K. Chan

doi:10.1016/j.tsf.2008.05.038

Spectroscopic ellipsometry characterization of polymer-fullerene blend films

A. M.C. Ng, K. Y. Cheung, M. K. Fung, A. B. Djurišić, W. K. Chan

Research output: Contribution to journal › Article › peer-review

23 Citations (Scopus)

Abstract

In this work, we have used spectroscopic ellipsometry (SE) and atomic force microscopy (AFM) to characterize the properties of blend films commonly used in organic solar cells, namely poly[3-hexylthiophene-2,5-diyl] (P3HT): [6,6]-phenyl C61 butyric acid methyl ester (PCBM) blends. The blend films were prepared using different solvents, and for different ratios of P3HT:PCBM in order to change the surface roughness and phase separation in the blends. The obtained SE results were analyzed with and without the surface roughness correction to examine how the morphology affects the optical properties.

Original language	English
Pages (from-to)	1047-1052
Number of pages	6
Journal	Thin Solid Films
Volume	517
Issue number	3
DOIs	https://doi.org/10.1016/j.tsf.2008.05.038
Publication status	Published - 1 Dec 2008
Externally published	Yes

Keywords

Polymers
Spectroscopic ellipsometry

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10.1016/j.tsf.2008.05.038

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title = "Spectroscopic ellipsometry characterization of polymer-fullerene blend films",

abstract = "In this work, we have used spectroscopic ellipsometry (SE) and atomic force microscopy (AFM) to characterize the properties of blend films commonly used in organic solar cells, namely poly[3-hexylthiophene-2,5-diyl] (P3HT): [6,6]-phenyl C61 butyric acid methyl ester (PCBM) blends. The blend films were prepared using different solvents, and for different ratios of P3HT:PCBM in order to change the surface roughness and phase separation in the blends. The obtained SE results were analyzed with and without the surface roughness correction to examine how the morphology affects the optical properties.",

keywords = "Polymers, Spectroscopic ellipsometry",

author = "Ng, {A. M.C.} and Cheung, {K. Y.} and Fung, {M. K.} and Djuri{\v s}i{\'c}, {A. B.} and Chan, {W. K.}",

year = "2008",

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doi = "10.1016/j.tsf.2008.05.038",

language = "English",

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T1 - Spectroscopic ellipsometry characterization of polymer-fullerene blend films

AU - Ng, A. M.C.

AU - Cheung, K. Y.

AU - Fung, M. K.

AU - Djurišić, A. B.

AU - Chan, W. K.

PY - 2008/12/1

Y1 - 2008/12/1

N2 - In this work, we have used spectroscopic ellipsometry (SE) and atomic force microscopy (AFM) to characterize the properties of blend films commonly used in organic solar cells, namely poly[3-hexylthiophene-2,5-diyl] (P3HT): [6,6]-phenyl C61 butyric acid methyl ester (PCBM) blends. The blend films were prepared using different solvents, and for different ratios of P3HT:PCBM in order to change the surface roughness and phase separation in the blends. The obtained SE results were analyzed with and without the surface roughness correction to examine how the morphology affects the optical properties.

AB - In this work, we have used spectroscopic ellipsometry (SE) and atomic force microscopy (AFM) to characterize the properties of blend films commonly used in organic solar cells, namely poly[3-hexylthiophene-2,5-diyl] (P3HT): [6,6]-phenyl C61 butyric acid methyl ester (PCBM) blends. The blend films were prepared using different solvents, and for different ratios of P3HT:PCBM in order to change the surface roughness and phase separation in the blends. The obtained SE results were analyzed with and without the surface roughness correction to examine how the morphology affects the optical properties.

KW - Polymers

KW - Spectroscopic ellipsometry

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DO - 10.1016/j.tsf.2008.05.038

M3 - Article

AN - SCOPUS:56649112941

SN - 0040-6090

VL - 517

SP - 1047

EP - 1052

JO - Thin Solid Films

JF - Thin Solid Films

IS - 3

ER -

Spectroscopic ellipsometry characterization of polymer-fullerene blend films

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Keywords

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