TY - JOUR
T1 - Selective and Adaptive Incremental Transfer Learning with Multiple Datasets for Machine Fault Diagnosis
AU - Chui, Kwok Tai
AU - Gupta, Brij B.
AU - Arya, Varsha
AU - Torres-Ruiz, Miguel
N1 - Publisher Copyright:
© 2024 Tech Science Press. All rights reserved.
PY - 2024
Y1 - 2024
N2 - The visions of Industry 4.0 and 5.0 have reinforced the industrial environment. They have also made artificial intelligence incorporated as a major facilitator. Diagnosing machine faults has become a solid foundation for automatically recognizing machine failure, and thus timely maintenance can ensure safe operations. Transfer learning is a promising solution that can enhance the machine fault diagnosis model by borrowing pre-trained knowledge from the source model and applying it to the target model, which typically involves two datasets. In response to the availability of multiple datasets, this paper proposes using selective and adaptive incremental transfer learning (SA-ITL), which fuses three algorithms, namely, the hybrid selective algorithm, the transferability enhancement algorithm, and the incremental transfer learning algorithm. It is a selective algorithm that enables selecting and ordering appropriate datasets for transfer learning and selecting useful knowledge to avoid negative transfer. The algorithmalso adaptively adjusts the portion of training data to balance the learning rate and training time. The proposed algorithm is evaluated and analyzed using ten benchmark datasets. Compared with other algorithms fromexisting works, SA-ITL improves the accuracy of all datasets. Ablation studies present the accuracy enhancements of the SA-ITL, including the hybrid selective algorithm (1.22%–3.82%), transferability enhancement algorithm (1.91%–4.15%), and incremental transfer learning algorithm (0.605%–2.68%). These also show the benefits of enhancing the target model with heterogeneous image datasets that widen the range of domain selection between source and target domains.
AB - The visions of Industry 4.0 and 5.0 have reinforced the industrial environment. They have also made artificial intelligence incorporated as a major facilitator. Diagnosing machine faults has become a solid foundation for automatically recognizing machine failure, and thus timely maintenance can ensure safe operations. Transfer learning is a promising solution that can enhance the machine fault diagnosis model by borrowing pre-trained knowledge from the source model and applying it to the target model, which typically involves two datasets. In response to the availability of multiple datasets, this paper proposes using selective and adaptive incremental transfer learning (SA-ITL), which fuses three algorithms, namely, the hybrid selective algorithm, the transferability enhancement algorithm, and the incremental transfer learning algorithm. It is a selective algorithm that enables selecting and ordering appropriate datasets for transfer learning and selecting useful knowledge to avoid negative transfer. The algorithmalso adaptively adjusts the portion of training data to balance the learning rate and training time. The proposed algorithm is evaluated and analyzed using ten benchmark datasets. Compared with other algorithms fromexisting works, SA-ITL improves the accuracy of all datasets. Ablation studies present the accuracy enhancements of the SA-ITL, including the hybrid selective algorithm (1.22%–3.82%), transferability enhancement algorithm (1.91%–4.15%), and incremental transfer learning algorithm (0.605%–2.68%). These also show the benefits of enhancing the target model with heterogeneous image datasets that widen the range of domain selection between source and target domains.
KW - Deep learning
KW - incremental learning
KW - machine fault diagnosis
KW - negative transfer
KW - transfer learning
UR - http://www.scopus.com/inward/record.url?scp=85185278256&partnerID=8YFLogxK
U2 - 10.32604/cmc.2023.046762
DO - 10.32604/cmc.2023.046762
M3 - Article
AN - SCOPUS:85185278256
SN - 1546-2218
VL - 78
SP - 1363
EP - 1378
JO - Computers, Materials and Continua
JF - Computers, Materials and Continua
IS - 1
ER -