Reliability of epoxy-based polymer optical waveguide devices under high temperature

W. F. Ho; W. Y. Chan; M. A. Uddin; H. P. Chan

Reliability of epoxy-based polymer optical waveguide devices under high temperature

W. F. Ho, W. Y. Chan, M. A. Uddin, H. P. Chan

Electronic Engineering and Computer Science

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	434-441
Number of pages	8
Journal	Journal of Optoelectronics and Advanced Materials
Volume	10
Issue number	2
Publication status	Published - Feb 2008

Keywords

High temperature
Optical waveguide
Refractive index
Reliability
Waveguide geometry

Cite this

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title = "Reliability of epoxy-based polymer optical waveguide devices under high temperature",

keywords = "High temperature, Optical waveguide, Refractive index, Reliability, Waveguide geometry",

author = "Ho, {W. F.} and Chan, {W. Y.} and Uddin, {M. A.} and Chan, {H. P.}",

year = "2008",

month = feb,

language = "English",

volume = "10",

pages = "434--441",

number = "2",

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T1 - Reliability of epoxy-based polymer optical waveguide devices under high temperature

AU - Ho, W. F.

AU - Chan, W. Y.

AU - Uddin, M. A.

AU - Chan, H. P.

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KW - High temperature

KW - Optical waveguide

KW - Refractive index

KW - Reliability

KW - Waveguide geometry

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M3 - Article

SN - 1454-4164

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EP - 441

JO - Journal of Optoelectronics and Advanced Materials

JF - Journal of Optoelectronics and Advanced Materials

IS - 2

ER -

Reliability of epoxy-based polymer optical waveguide devices under high temperature

Keywords

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