Method for measurement of the density of thin films of small organic molecules

Hai Feng Xiang; Zong Xiang Xu; V. A.L. Roy; Chi Ming Che; P. T. Lai

doi:10.1063/1.2712932

Method for measurement of the density of thin films of small organic molecules

Hai Feng Xiang
, Zong Xiang Xu
, V. A.L. Roy
, Chi Ming Che
, P. T. Lai

Research output: Contribution to journal › Article › peer-review

58 Citations (Scopus)

Abstract

An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum (Alq₃) thin film was 1.31±0.01 g/cm³. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking.

Original language	English
Article number	034104
Journal	Review of Scientific Instruments
Volume	78
Issue number	3
DOIs	https://doi.org/10.1063/1.2712932
Publication status	Published - 2007
Externally published	Yes

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title = "Method for measurement of the density of thin films of small organic molecules",

abstract = "An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum (Alq3) thin film was 1.31±0.01 g/cm3. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking.",

author = "Xiang, \{Hai Feng\} and Xu, \{Zong Xiang\} and Roy, \{V. A.L.\} and Che, \{Chi Ming\} and Lai, \{P. T.\}",

note = "Funding Information: This work is supported by the University Development Fund (Nanotechnology Research Institute, Project No. 00600009) of The University of Hong Kong, and RGC of HKSAR, China (Project No. HKU 7158/04E).",

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doi = "10.1063/1.2712932",

language = "English",

volume = "78",

number = "3",

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T1 - Method for measurement of the density of thin films of small organic molecules

AU - Xiang, Hai Feng

AU - Xu, Zong Xiang

AU - Roy, V. A.L.

AU - Che, Chi Ming

AU - Lai, P. T.

N1 - Funding Information: This work is supported by the University Development Fund (Nanotechnology Research Institute, Project No. 00600009) of The University of Hong Kong, and RGC of HKSAR, China (Project No. HKU 7158/04E).

PY - 2007

Y1 - 2007

N2 - An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum (Alq3) thin film was 1.31±0.01 g/cm3. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking.

AB - An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum (Alq3) thin film was 1.31±0.01 g/cm3. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking.

UR - https://www.scopus.com/pages/publications/34047109700

U2 - 10.1063/1.2712932

DO - 10.1063/1.2712932

M3 - Article

C2 - 17411199

AN - SCOPUS:34047109700

SN - 0034-6748

VL - 78

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 3

M1 - 034104

ER -

Method for measurement of the density of thin films of small organic molecules

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