From Industry 4.0 to Industry 5.0: Challenges and Opportunities in the Testing Inspection and Certification (TIC) Industry
- C. H. Li
- , H. Y. Yuen
- , T. T. Lee
- , C. Ng
- , S. L. Mak
- , W. F. Tang
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Citation
(Scopus)