Estimation of the uncertainty of Fe in metallic silicon determined by inductively coupled plasmas-atomic emission spectroscopy

Dou Wen Wang, Shao Wei Wang, Si Qi Zhao

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

This practice provides information for combining standard uncertainties of Fe in metallic silicon determined by the ICP-AES method of the China Inspection and Quarantine (CIQ). The measurand Fe% is determined from other quantities p.q.r . . . through a functional relationship of the model f: Fe% = f(p.q.r . . .). The estimated standard deviation associated with the output estimate Fe%, called combined standard uncertainty and denoted by uc (Fe%), is determined from the estimated standard deviation associated with each larger input estimate (p.q.r . . .). The combined variance uc2 (Fe%) can be viewed, by the sensitivity coefficients, as a sum of terms with the minor errors omitted.

Original languageEnglish
Pages (from-to)211-215
Number of pages5
JournalJournal of Testing and Evaluation
Volume33
Issue number3
DOIs
Publication statusPublished - May 2005

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