Enhancing Valid Test Input Generation with Distribution Awareness for Deep Neural Networks

Jingyu Zhang, Jacky Keung, Xiaoxue Ma, Xiangyu Li, Yan Xiao, Yishu Li, Wing Kwong Chan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Comprehensive testing is important in improving the reliability of Deep Learning (DL)-based systems. Various Test Input Generators (TIGs) have been proposed to generate misbehavior-inducing test inputs. However, the lack of validity checking in TIGs often results in the generation of invalid inputs (i.e., out of the learned distribution), leading to unreliable testing. To save the effort of manually checking the validity and improve test efficiency, it is important to assess the effectiveness and reliability of automated validators. In this study, we comprehensively assess four automated Input Validators (IV s), Our findings show that the accuracy of IVs ranges from 49% to 77%. Distance-based IVs generally outperform reconstruction-based and density-based IVs for both classification and regression tasks. Based on the findings, we enhance existing testing frameworks by incorporating distribution awareness through joint optimization. The results demonstrate our framework leads to a 2 % to 10% increase in the number of valid inputs, which establishes our method as an effective technique for valid test input generation.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE 48th Annual Computers, Software, and Applications Conference, COMPSAC 2024
EditorsHossain Shahriar, Hiroyuki Ohsaki, Moushumi Sharmin, Dave Towey, AKM Jahangir Alam Majumder, Yoshiaki Hori, Ji-Jiang Yang, Michiharu Takemoto, Nazmus Sakib, Ryohei Banno, Sheikh Iqbal Ahamed
Pages1095-1100
Number of pages6
ISBN (Electronic)9798350376968
DOIs
Publication statusPublished - 2024
Externally publishedYes
Event48th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2024 - Osaka, Japan
Duration: 2 Jul 20244 Jul 2024

Publication series

NameProceedings - 2024 IEEE 48th Annual Computers, Software, and Applications Conference, COMPSAC 2024

Conference

Conference48th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2024
Country/TerritoryJapan
CityOsaka
Period2/07/244/07/24

Keywords

  • Anomaly Detection
  • Deep Learning
  • Input Validation
  • Software Testing

Fingerprint

Dive into the research topics of 'Enhancing Valid Test Input Generation with Distribution Awareness for Deep Neural Networks'. Together they form a unique fingerprint.

Cite this