Deep Learning Based Hate Speech Detection on Twitter

Akshat Gaurav, Brij B. Gupta, Kwok Tai Chui, Varsha Arya, Priyanka Chaurasia

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

There have been growing worries about the effects of the widespread use of hate speech and harsh language on social media sites like Twitter. Effective strategies for recognising and reducing such dangerous material are necessary for resolving this problem. In this research, we give a detailed analysis of four deep learning models for identifying hate speech and inflammatory language on Twitter: the Long Short-Term Memory (LSTM), the Recurrent Neural Network (RNN), the Bidirectional LSTM (Bi-LSTM), and the Gated Recurrent Unit (GRU). We downloaded a large dataset from Kaggle that was curated for hate speech identification and used it in our experiment. We built each model after preprocessing and tokenization, then tweaked their hyperparameters for maximum efficiency. The models' abilities to detect hate speech were evaluated using standard measures including accuracy, precision, recall, and Fl-score. Our findings show that there is a wide range of effectiveness amongst models in terms of identifying hate speech and inflammatory language on Twitter. In terms of accuracy and Fl-scores, the Bi-LSTM and GRU models were superior to the LSTM and RNN. The results of this study imply that using bidirectional and gated processes may increase the models' capability of understanding the interdependencies and contexts of tweets, and hence, their classification accuracy.

Original languageEnglish
Title of host publication2023 IEEE 13th International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2023
ISBN (Electronic)9798350324150
DOIs
Publication statusPublished - 2023
Externally publishedYes
Event13th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2023 - Berlin, Germany
Duration: 4 Sept 20225 Sept 2022

Publication series

NameIEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin
ISSN (Print)2166-6814
ISSN (Electronic)2166-6822

Conference

Conference13th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2023
Country/TerritoryGermany
CityBerlin
Period4/09/225/09/22

Keywords

  • Bi-LSTM
  • GRU
  • Hate Speech
  • LSTM
  • RNN
  • Twitter

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