A smoothness index based approach for off-line signature verification

B. Fang, Y. Y. Wang, C. H. Leung, Y. Y. Tang, P. C.K. Kwok, K. W. Tse, Y. K. Wong

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

15 Citations (Scopus)

Abstract

Proposes a method to tackle the problem of detecting skilled forgeries in off-line signature verification. Inspired by the approach adopted by expert examiners, it is based on a smoothness criterion. From a collection of genuine and forged signatures, it is observed that, although skilled forgery signatures are very similar to genuine ones on a global scale, they are generally less smooth and natural on a detailed scale than the genuine ones, especially for those skilled forgery signatures which consist of cursive graphic patterns. A smoothness index is derived from such signatures. This is combined with other global shape features and used for verification. Satisfactory results are obtained.

Original languageEnglish
Title of host publicationProceedings of the 5th International Conference on Document Analysis and Recognition, ICDAR 1999
Pages788-791
Number of pages4
ISBN (Electronic)0769503187
DOIs
Publication statusPublished - 1999
Event5th International Conference on Document Analysis and Recognition, ICDAR 1999 - Bangalore, India
Duration: 20 Sept 199922 Sept 1999

Publication series

NameProceedings of the International Conference on Document Analysis and Recognition, ICDAR
ISSN (Print)1520-5363

Conference

Conference5th International Conference on Document Analysis and Recognition, ICDAR 1999
Country/TerritoryIndia
CityBangalore
Period20/09/9922/09/99

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