TY - GEN
T1 - A smoothness index based approach for off-line signature verification
AU - Fang, B.
AU - Wang, Y. Y.
AU - Leung, C. H.
AU - Tang, Y. Y.
AU - Kwok, P. C.K.
AU - Tse, K. W.
AU - Wong, Y. K.
N1 - Publisher Copyright:
© 1999 IEEE.
PY - 1999
Y1 - 1999
N2 - Proposes a method to tackle the problem of detecting skilled forgeries in off-line signature verification. Inspired by the approach adopted by expert examiners, it is based on a smoothness criterion. From a collection of genuine and forged signatures, it is observed that, although skilled forgery signatures are very similar to genuine ones on a global scale, they are generally less smooth and natural on a detailed scale than the genuine ones, especially for those skilled forgery signatures which consist of cursive graphic patterns. A smoothness index is derived from such signatures. This is combined with other global shape features and used for verification. Satisfactory results are obtained.
AB - Proposes a method to tackle the problem of detecting skilled forgeries in off-line signature verification. Inspired by the approach adopted by expert examiners, it is based on a smoothness criterion. From a collection of genuine and forged signatures, it is observed that, although skilled forgery signatures are very similar to genuine ones on a global scale, they are generally less smooth and natural on a detailed scale than the genuine ones, especially for those skilled forgery signatures which consist of cursive graphic patterns. A smoothness index is derived from such signatures. This is combined with other global shape features and used for verification. Satisfactory results are obtained.
UR - http://www.scopus.com/inward/record.url?scp=85011854210&partnerID=8YFLogxK
U2 - 10.1109/ICDAR.1999.791905
DO - 10.1109/ICDAR.1999.791905
M3 - Conference contribution
AN - SCOPUS:85011854210
T3 - Proceedings of the International Conference on Document Analysis and Recognition, ICDAR
SP - 788
EP - 791
BT - Proceedings of the 5th International Conference on Document Analysis and Recognition, ICDAR 1999
T2 - 5th International Conference on Document Analysis and Recognition, ICDAR 1999
Y2 - 20 September 1999 through 22 September 1999
ER -